Special Section: Selected Papers from the 2nd Mediterranean Conference on Nanophotonics

Estimation of polyethylene nanothin layer morphology by differential evanescent light intensity imaging

[+] Author Affiliations
Nina Mirchin, Michael Gankin, Uri Gorodetsky, Simona A. Popescu, Igor Lapsker, Aaron Peled

Holon Institute of Technology, Department of Electrical and Electronics Engineering, Photonics Laboratory, Holon, 58102 Israel

Liviu Duta, Gabriela Dorcioman, Andrei Popescu, Ion N. Mihailescu

National Institute for Lasers, Plasma and Radiation Physics, Lasers Department, PO Box MG-54, Bucharest-Magurele, RO-77125 Romania

J. Nanophoton. 4(1), 041760 (July 20, 2010). doi:10.1117/1.3477983
History: Received January 28, 2010; Revised June 10, 2010; Accepted June 25, 2010; July 20, 2010; Online July 20, 2010
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Abstract

We investigated the morphology of polyethylene films by the Differential Evanescent Light Intensity (DELI) imaging method developed by us previously. The films were prepared by the Matrix Assisted Pulsed Laser Evaporation (MAPLE) technique. Rough or smooth organic layers were fabricated with thickness depending on the deposition conditions. We used the DELI imaging method here as a fast, low cost method for surface morphology diagnostics of large areas (i.e., hundreds of mm2) of nano layer polyethylene films.

© 2010 Society of Photo-Optical Instrumentation Engineers

Citation

Nina Mirchin ; Michael Gankin ; Uri Gorodetsky ; Simona A. Popescu ; Igor Lapsker, et al.
"Estimation of polyethylene nanothin layer morphology by differential evanescent light intensity imaging", J. Nanophoton. 4(1), 041760 (July 20, 2010). ; http://dx.doi.org/10.1117/1.3477983


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