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Surface-enhanced Raman scattering from semi-continuous silver film templates etched by focused ion beams

[+] Author Affiliations
Bhanu Prakash, Dhamodaran Santhanagopalan

Indian Institute of Technology Kanpur, Department of Physics, Kalyanpur, Kanpur, UP 208016 India

J. Nanophoton. 4(1), 049504 (September 24, 2010). doi:10.1117/1.3502030
History: Received August 12, 2010; Revised August 27, 2010; Accepted September 20, 2010; September 24, 2010; Online September 24, 2010
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Abstract

Semi-continuous silver film templates are fabricated by focused ion beams (FIB), and surface-enhanced Raman scattering spectra from C60-fullerene deposited on these templates are recorded. Films of silver deposited by thermal evaporation are dry-etched by the ion beams with various etching times. The films tend to become semi-continuous as the etch-time increases. The Raman spectra of C60 show an increase in intensity upon correction with a silver coverage area for increasing etch-times. Increase in Raman intensity is due to the sharp edges of the FIB-etched semi-continuous templates, and the moderate enhancements are attributed to dissipation induced by gallium incorporation. A maximum enhancement factor of about 4×106 is observed, which is comparable with other experimental values. Controlling gallium incorporation during processing or by post processing treatments is being explored, which can help increase the enhancement factor.

© 2010 Society of Photo-Optical Instrumentation Engineers

Citation

Bhanu Prakash and Dhamodaran Santhanagopalan
"Surface-enhanced Raman scattering from semi-continuous silver film templates etched by focused ion beams", J. Nanophoton. 4(1), 049504 (September 24, 2010). ; http://dx.doi.org/10.1117/1.3502030


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