Special Section: Selected Papers from the 3rd Mediterranean Conference on Nanophotonics

Spectroscopic ellipsometry of few-layer graphene

[+] Author Affiliations
Goran Isić

University of Belgrade, Institute of Physics, Pregrevica 118, 11080 Belgrade, Serbia

University of Leeds, School of Electronic and Electrical Engineering, Leeds LS2 9JT, United Kingdom

Milka Jakovljević, Marko Filipović, Djordje Jovanović, Borislav Vasić, Saša Lazović, Nevena Puač, Zoran Lj. Petrović, Radmila Kostić, Radoš Gajić

University of Belgrade, Institute of Physics, Pregrevica 118, 11080 Belgrade, Serbia

Jozef Humlíček

Masaryk University Brno, Department of Condensed Matter Physics, Faculty of Science, Kotlarska 2, CZ 61137 Brno, Czech Republic

Maria Losurdo, Giovanni Bruno

University of Bari, Institute of Inorganic Methodologies and of Plasmas, IMIP-CNR, Department of Chemistry, via Orabona 4, 70126 Bari, Italy

Iris Bergmair

Functional Surfaces and Nanostructures, Profactor GmbH, Im Stadtgut A2, 4407 Steyr-Gleink, Austria

Kurt Hingerl

Johannes Kepler University Linz, Center for Surface- and Nanoanalytics, Altenbergerstr. 69, A-4040 Linz, Austria

J. Nanophoton. 5(1), 051809 (June 08, 2011). doi:10.1117/1.3598162
History: Received February 02, 2011; Revised May 02, 2011; Accepted May 18, 2011; Published June 08, 2011; Online June 08, 2011
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The optical properties of few-layer graphene (FLG) films were measured in the ultraviolet and visible spectrum using a spectroscopic ellipsometer equipped with a 50-μm nominal microspot size. The FLG thickness was found by atomic force microscopy. Measurements revealed that the microspot is larger than the FLG flake. The ellipsometric data was interpreted using the island-film model. Comparison with graphite and recently published graphene data showed reasonable agreement, but with some features that could not be explained. The error margin for the optical constants was estimated to be ±10%.

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© 2011 Society of Photo-Optical Instrumentation Engineers (SPIE)

Citation

Goran Isić ; Milka Jakovljević ; Marko Filipović ; Djordje Jovanović ; Borislav Vasić, et al.
"Spectroscopic ellipsometry of few-layer graphene", J. Nanophoton. 5(1), 051809 (June 08, 2011). ; http://dx.doi.org/10.1117/1.3598162


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