Special Section on Nanoscale Morphology to Honor Russell Messier

Analysis of the optical properties and structure of serial bi-deposited TiO2 chiral sculptured thin films using Mueller matrix ellipsometry

[+] Author Affiliations
Nikolas J. Podraza, Sean M. Pursel

Materials Research Institute, The Pennsylvania State University, 272 Materials Research Laboratory, University Park, Pennsylvania 16802

Chi Chen

Center for Photovoltaics Innovation and Commercialization, University of Toledo, Toledo, Ohio 43606

Mark W. Horn

Materials Research Institute, The Pennsylvania State University, 272 Materials Research Laboratory, University Park, Pennsylvania 16802

Robert W. Collins

Center for Photovoltaics Innovation and Commercialization, University of Toledo, Toledo, Ohio 43606

J. Nanophoton. 2(1), 021930 (December 10, 2008). doi:10.1117/1.3062210
History: Received September 7, 2008; Revised December 2, 2008; Accepted December 2, 2008; December 10, 2008; Online December 10, 2008
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Abstract

A titanium dioxide (TiO2) chiral sculptured thin film (STF) fabricated using a serial bi-deposition (SBD) method based on electron beam evaporation has been studied using spectroscopic Mueller matrix ellipsometry (MME). Complete Mueller matrices for the SBD TiO2 chiral STF have been measured using a dual-rotating compensator spectroscopic ellipsometer over the spectral range from 250 to 825 nm in transmission mode, both at normal incidence (θi = 0°) and over a range of oblique angles (5° ⩽ θi ⩽ 60°). A multilayer structurally-graded optical model has been applied to deduce spectra in the three principal indices of refraction that characterize the locally biaxial structure, using as input the complex amplitude transmission ratios deduced from the Mueller matrix measured at normal incidence. A Bragg resonance feature has been observed, and this feature blue-shifts with increasing angle of incidence. Predictions of the transmittance for circularly polarized light normally incident upon the SBD TiO2 chiral STF can be obtained simply by multiplying the unnormalized Mueller matrix by the appropriate Stokes vector, and the results are in excellent agreement with direct measurements.

© 2008 Society of Photo-Optical Instrumentation Engineers

Citation

Nikolas J. Podraza ; Sean M. Pursel ; Chi Chen ; Mark W. Horn and Robert W. Collins
"Analysis of the optical properties and structure of serial bi-deposited TiO2 chiral sculptured thin films using Mueller matrix ellipsometry", J. Nanophoton. 2(1), 021930 (December 10, 2008). ; http://dx.doi.org/10.1117/1.3062210


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