Review Papers

Optical properties of silicon nanocrystal superlattices

[+] Author Affiliations
David J. Lockwood

Institute for Microstructural Sciences, National Research Council of Canada, 1200 Montreal Road, Ottawa, Ontario K1A 0R6 Canada

Leonid Tsybeskov

Department of Electrical and Computer Engineering, New Jersey Institute of Technology, Newark, NJ 07102

J. Nanophoton. 2(1), 022501 (March 27, 2008). doi:10.1117/1.2910994
History: Received December 28, 2007; Revised March 25, 2008; Accepted March 26, 2008; March 27, 2008; Online March 27, 2008
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Abstract

The many interesting and unique physical properties of nanocrystalline-Si/amorphous-SiO2 superlattices stem from their vertical periodicity and nearly defect-free, atomically flat, and chemically abrupt nanocrystalline-Si/SiO2 interfaces. By combining a less than 5% variation in the initial as-grown amorphous-Si layer thickness with control over the Si nanocrystal shape and crystallographic orientation produced via an appropriate annealing process, systems of nearly identical Si nanocrystals having remarkably different shapes (spheres, ovoids, bricks, etc.) have been produced. Such details governing the fabrication of nanocrystalline-Si/amorphous-SiO2 superlattices have dramatic effects on their structural and optical-Raman scattering and photoluminescence-properties. The reliable fabrication of Si-based nanostructures with control over the nanocrystal size, shape, and crystallographic orientation is an important first step in their applications in Si photonics.

© 2008 Society of Photo-Optical Instrumentation Engineers

Citation

David J. Lockwood and Leonid Tsybeskov
"Optical properties of silicon nanocrystal superlattices", J. Nanophoton. 2(1), 022501 (March 27, 2008). ; http://dx.doi.org/10.1117/1.2910994


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