Research Papers

Anisotropy in polyetheretherketone films

[+] Author Affiliations
Jasmin Althaus

University of Basel, Biomaterials Science Center, c/o University Hospital Basel, 4031 Basel, Switzerland

Hans Deyhle

University of Basel, Biomaterials Science Center, c/o University Hospital Basel, 4031 Basel, Switzerland

Paul Scherrer Institute, Swiss Light Source, 5232 Villigen, Switzerland

Oliver Bunk

Paul Scherrer Institute, Swiss Light Source, 5232 Villigen, Switzerland

Per Magnus Kristiansen

University of Applied Sciences and Arts Northwestern Switzerland, Institutes of Polymer Engineering & Polymer Nanotechnology, 5210 Windisch, Switzerland

Bert Müller

University of Basel, Biomaterials Science Center, c/o University Hospital Basel, 4031 Basel, Switzerland

J. Nanophoton. 6(1), 063510 (Jul 02, 2012). doi:10.1117/1.JNP.6.063510
History: Received February 16, 2012; Revised March 29, 2012; Accepted April 2, 2012
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Abstract.  Optical measurements reveal the preferential orientation of nanostructures within polymer films, which results from the fabrication process including mechanical and thermal treatments. As the wavelength of the incident light is generally much larger than the characteristic dimensions of the molecular arrangement in semi-crystalline or amorphous polymers, the optical signal originates not directly from the nanostructure of the polymers. Linear dichroism measurements were correlated with synchrotron radiation-based x-ray scattering data on commercially available polyetheretherketone (PEEK) thin films (12 to 50 μm). Annealing changed the structure of amorphous films to semi-crystalline ones associated with the measured linear dichroism. The intensity of the measured anisotropic signal depended on the film thickness. While for wavelengths between 450 and 1100 nm the transmission was higher when the polarizer was parallel to the machine direction, for larger wavelengths maximum transmission was observed with the polarizer perpendicular to the machine direction indicating excitations parallel and perpendicular to the PEEK molecule axis, respectively. Annealing PEEK films at temperatures between 160 and 240°C decreased the transmission at 540 nm by a factor of two, whereas the anisotropy remained constant. x-ray scattering revealed strongest anisotropy for a periodicity of 15 nm in the machine direction of the cast film extrusion process. The long-range order of amorphous and semi-crystalline entities can explain the x-ray scattering data and the related optical anisotropy of casted PEEK films.

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© 2012 Society of Photo-Optical Instrumentation Engineers

Citation

Jasmin Althaus ; Hans Deyhle ; Oliver Bunk ; Per Magnus Kristiansen and Bert Müller
"Anisotropy in polyetheretherketone films", J. Nanophoton. 6(1), 063510 (Jul 02, 2012). ; http://dx.doi.org/10.1117/1.JNP.6.063510


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