Errata

Publisher’s note: Tunable stoichiometry of BCxNy thin films through multitarget pulsed laser deposition monitored via in situ ellipsometry

[+] Author Affiliations
John G. Jones, Neil R. Murphy, Rachel Jakubiak

Air Force Research Laboratory, 3005 Hobson Way, Wright-Patterson AFB, Ohio 45433

Lirong Sun

General Dynamics Information Technology, 5100 Springfield Road, Dayton, Ohio 45431

Tyson C. Back, Matthew A. Lange, Jessica L. Remmert

Universal Technology Corporation, 1270 North Fairfield Road, Dayton, Ohio 45532

P. Terrence Murray

University of Dayton Research Institute, 300 College Park, Dayton, Ohio 45469

J. Nanophoton. 8(1), 089999 (Feb 14, 2014). doi:10.1117/1.JNP.8.089999
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This article [J. Nanophoton.. 8, (1 ), 083890  ( Feb 5 , 2014)] mistakenly appeared in the Special Section on Metamaterials and Photonic Nanostructures. It was republished in the Special Section on Nanostructured Thin Films VI with a corrected CID on 10 February 2014. The updated citation is shown below:

Jones  J. G. et al., “Tunable stoichiometry of BCxNy thin films through multitarget pulsed laser deposition monitored via in situ ellipsometry,” J. Nanophoton.. 8, , 083999  (2014).

© The Authors. Published by SPIE under a Creative Commons Attribution 3.0 Unported License. Distribution or reproduction of this work in whole or in part requires full attribution of the original publication, including its DOI.

Citation

John G. Jones ; Lirong Sun ; Neil R. Murphy ; Tyson C. Back ; Matthew A. Lange, et al.
"Publisher’s note: Tunable stoichiometry of BCxNy thin films through multitarget pulsed laser deposition monitored via in situ ellipsometry", J. Nanophoton. 8(1), 089999 (Feb 14, 2014). ; http://dx.doi.org/10.1117/1.JNP.8.089999


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