On the sensitivity of directions that support Voigt wave propagation in infiltrated biaxial dielectric materials

Tom G. Mackay

doi:10.1117/1.JNP.8.083993

25 March 2014 On the sensitivity of directions that support Voigt wave propagation in infiltrated biaxial dielectric materials

Tom G. Mackay

Author Affiliations +

Journal of Nanophotonics, Vol. 8, Issue 1, 083993 (March 2014). https://doi.org/10.1117/1.JNP.8.083993

Abstract

Voigt wave propagation (VWP) was considered in a porous biaxial dielectric material that was infiltrated with a material of refractive index n _a . The infiltrated material was regarded as a homogenized composite material in the long wavelength regime, and its constitutive parameters were estimated using the extended Bruggeman homogenization formalism. In our numerical studies, the directions that support VWP were found to vary by as much as 300 deg per RIU as the refractive index n a was varied. The sensitivities achieved were acutely dependent upon the refractive index n a and the degrees of anisotropy and dissipation of the porous biaxial material. The orientations, shapes, and sizes of the particles that constitute the infiltrating material and the porous biaxial material exerted only a secondary influence on the maximum sensitivities achieved. Also, for the parameter ranges considered, the degree of porosity of the biaxial material had little effect on the maximum sensitivities achieved. These numerical findings bode well for the possible harnessing of VWP for optical sensing applications.

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Tom G. Mackay "On the sensitivity of directions that support Voigt wave propagation in infiltrated biaxial dielectric materials," Journal of Nanophotonics 8(1), 083993 (25 March 2014). https://doi.org/10.1117/1.JNP.8.083993

Published: 25 March 2014

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