Special Section on Nanostructured Thin Films: Evolving Perspectives

Terahertz conductivity characterization of nanostructured graphene-like films for optoelectronic applications

[+] Author Affiliations
Ehsan Dadrasnia

Carlos III de Madrid University, Optoelectronics and Laser Technology Group (GOTL), 28911 Leganes, Madrid, Spain

Horacio Lamela

Carlos III de Madrid University, Optoelectronics and Laser Technology Group (GOTL), 28911 Leganes, Madrid, Spain

J. Nanophoton. 9(1), 093598 (Jan 19, 2015). doi:10.1117/1.JNP.9.093598
History: Received September 26, 2014; Accepted November 12, 2014
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Abstract.  Difficulty in deposition and integration of fragile graphene-like samples for optoelectronic devices may prevent a multiple contact measurement procedure. We employed noncontact and nondestructive transmission and reflection terahertz (THz)-pulsed spectroscopy to investigate not only the electrical conductivity, but also to study the optical properties of one-dimensional and two-dimensional graphene-like samples. The Drude and non-Drude models were applied to observe and compare the ultrafast carrier transport parameters and high mobility characteristic of such high conductance-nanostructured thin films without requirement for postprocess patterning. The diffusive coefficient and nanoscopic characteristic length from noncontact THz measurement enables us to predict the cut-off frequency of such devices in relevant optoelectronic applications in sub-THz and THz frequencies. The results show that the cut-off frequency of the devices increases with a reduction of the channel length.

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© 2015 Society of Photo-Optical Instrumentation Engineers

Citation

Ehsan Dadrasnia and Horacio Lamela
"Terahertz conductivity characterization of nanostructured graphene-like films for optoelectronic applications", J. Nanophoton. 9(1), 093598 (Jan 19, 2015). ; http://dx.doi.org/10.1117/1.JNP.9.093598


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