Research Papers

Flat focusing in reflection from a chirped dielectric mirror with a defect layer

[+] Author Affiliations
Yu-Chieh Cheng

Universitat Politècnica de Catalunya, Departament de Física i Enginyeria Nuclear, Rambla Sant Nebridi 22, Terrassa, Barcelona 08222, Spain

Simonas Kicas

State Research Institute for Physical Sciences and Technology, Savanoriu pr. 231, Vilnius 02300, Lithuania

Kestutis Staliunas

Universitat Politècnica de Catalunya, Departament de Física i Enginyeria Nuclear, Rambla Sant Nebridi 22, Terrassa, Barcelona 08222, Spain

Institució Catalana de Recerca i Estudis Avançats (ICREA), Pg. Lluis Companys, 23, Barcelona 08010, Spain

J. Nanophoton. 9(1), 093084 (Mar 04, 2015). doi:10.1117/1.JNP.9.093084
History: Received October 17, 2014; Accepted February 2, 2015
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Abstract.  Recently, the principle of flat focusing based on one-dimensionally chirped dielectric mirrors has been proposed and experimentally demonstrated. The flat chirped mirror causes anomalous diffraction of the beam during reflection, opposite to the normal diffraction in free space propagation. The anomalous diffraction compensates the normal diffraction of the beam resulting in focusing after reflection. For a better focusing performance and for a larger near-field focal distance, a stronger anomalous diffraction is required. We show that the anomalous diffraction can be enhanced by introducing a defect layer in the chirped mirror, as the structure becomes similar to a Gires–Tournois interferometer. The focal distance can be substantially increased due to the defect layer. In our specific structure, the focal distance shows an increase from 19 to 39μm, numerically.

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© 2015 Society of Photo-Optical Instrumentation Engineers

Citation

Yu-Chieh Cheng ; Simonas Kicas and Kestutis Staliunas
"Flat focusing in reflection from a chirped dielectric mirror with a defect layer", J. Nanophoton. 9(1), 093084 (Mar 04, 2015). ; http://dx.doi.org/10.1117/1.JNP.9.093084


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