Special Section on Nanocarbon Photonics and Optoelectronics

Experimental study of nitrogen-doped graphene by spectroscopic and probe methods of surface analysis

[+] Author Affiliations
Alexander Pereyaslavtsev

Dukhov Research Institute of Automatics (VNIIA), 22 Sushchevskaya Street, Moscow 127055, Russia

Maxim Rybin

Prokhorov General Physics Institute, 38 Vavilov Street, Moscow 119991, Russia

National Research Nuclear University MEPhI (Moscow Engineering Physics Institute), 31 Kashirskoye shosse, Moscow 115409, Russia

Tatiana Vasilieva, Vladimir Miasnikov

Moscow Institute of Physics and Technology, 9 Institutskiy per., Dolgoprudny, Moscow 141700, Russia

Igor Sokolov

Dukhov Research Institute of Automatics (VNIIA), 22 Sushchevskaya Street, Moscow 127055, Russia

Prokhorov General Physics Institute, 38 Vavilov Street, Moscow 119991, Russia

J. Nanophoton. 10(1), 012521 (Jan 22, 2016). doi:10.1117/1.JNP.10.012521
History: Received October 21, 2015; Accepted December 16, 2015
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Abstract.  This work demonstrates an integrated approach for studying graphene films with various doping levels of nitrogen. The graphene films grown by a chemical vapor deposition technique were doped by treatment in ammonia radio-frequency plasma discharge. The graphene samples were investigated by x-ray photoelectron spectroscopy with a parallel registration of photoemission angular dependence. The depth-dependent changes in the valence band structure and the nitrogen peak position were recorded. The shift of valence band maximum relative to the initial value (0.13±0.04  eV) was observed using ultraviolet photoelectron spectroscopy. The dispersion and the shift of π-plasmon maximum were registered while the percentage of nitrogen atoms in two-dimensional graphene network increased.

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© 2016 Society of Photo-Optical Instrumentation Engineers

Citation

Alexander Pereyaslavtsev ; Maxim Rybin ; Tatiana Vasilieva ; Vladimir Miasnikov and Igor Sokolov
"Experimental study of nitrogen-doped graphene by spectroscopic and probe methods of surface analysis", J. Nanophoton. 10(1), 012521 (Jan 22, 2016). ; http://dx.doi.org/10.1117/1.JNP.10.012521


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