1 December 2016 Förster resonance energy transfer between individual semiconductor nanocrystals and an InP film
Chiara Sinito, Xavier Quelin, Nathalie Simon, Pierrick Gautier, Anne-Marie Gonçalves, Stéphanie Buil, Jean-Pierre Hermier, Damien Aureau
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Abstract
The modification of the radiative decay of a single emitter in close vicinity to a dielectric interface is investigated by studying the photoluminescence (PL) decay dynamics of colloidal semiconductor nanocrystals (NCs) deposited on semiconductor surfaces. The PL decay lifetimes of single CdSe/CdS NCs spin-coated on InP surfaces passivated with thin oxide layers are measured. Electrochemical passivation of the InP surfaces with oxide layers of different thicknesses enables to study the influence of the distance between the semiconductor surface and the NC on the lifetime. A shortening of the PL decay lifetimes of the NCs with respect to their lifetimes on glass strongly suggests the opening of recombination channels for the photogenerated exciton, which we attribute to energy transfer between the NC and the semiconductor. We also experimentally show the influence of the orientation of the NC with respect to the semiconductor surface on the coupling.
© 2016 Society of Photo-Optical Instrumentation Engineers (SPIE) 1934-2608/2016/$25.00 © 2016 SPIE
Chiara Sinito, Xavier Quelin, Nathalie Simon, Pierrick Gautier, Anne-Marie Gonçalves, Stéphanie Buil, Jean-Pierre Hermier, and Damien Aureau "Förster resonance energy transfer between individual semiconductor nanocrystals and an InP film," Journal of Nanophotonics 10(4), 046014 (1 December 2016). https://doi.org/10.1117/1.JNP.10.046014
Published: 1 December 2016
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CITATIONS
Cited by 2 scholarly publications.
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KEYWORDS
Interfaces

Oxides

Semiconductors

Dielectrics

Glasses

Nanocrystals

Resonance energy transfer

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