Sharply focused azimuthally polarized beam characterized by photoinduced force microscopy (Conference Presentation)

Jinwei Zeng; Fei Huang; Caner Guclu; Mehdi Veysi; Hemantha K. Wickramasinghe; Filippo Capolino

doi:10.1117/12.2273091

21 September 2017 Sharply focused azimuthally polarized beam characterized by photoinduced force microscopy (Conference Presentation)

Jinwei Zeng, Fei Huang, Caner Guclu, Mehdi Veysi, Hemantha K. Wickramasinghe, Filippo Capolino

Author Affiliations +

Proceedings Volume 10350, Nanoimaging and Nanospectroscopy V; 103500T (2017) https://doi.org/10.1117/12.2273091
Event: SPIE Nanoscience + Engineering, 2017, San Diego, California, United States

Abstract

A sharply focused azimuthally polarized beam (APB) presents a strong longitudinal magnetic field with a vanishing electric field at its beam axis, forming an effective magnetic dominant region at the vicinity. This magnetic dominance is extremely desirable in the proposed high-speed ultra-compact optical magnetic force manipulation and microscopy, where the interaction between matter and the magnetic field of light can be exclusively exploited. However, direct characterization of such beam is challenging due to its subwavelength features. Here we show for the first time a direct characterization on a sharply focused APB in nanoscale using the novel Photoinduced Force Microscopy (PIFM) technique, which simultaneously excites and detects incident beam in near-field. Comparing to the Scanning Near-field Optical Microscopy (SNOM) which has near-field excitation and far-field detection, PIFM boasts a much smaller background noise and a more robust system. Based on the measured force-map, we develop a theoretical model to retrieve the corresponding electric and magnetic field distribution, and correct the distortion caused by the imperfect probe-tip of the PIFM. This research pioneers the exploration in the experimental investigation on the sharply focused structured light, unveiling its potentials in a plethora of optoelectronics, chemical, or biomedical applications.

Conference Presentation

Citation Download Citation

Jinwei Zeng, Fei Huang, Caner Guclu, Mehdi Veysi, Hemantha K. Wickramasinghe, and Filippo Capolino "Sharply focused azimuthally polarized beam characterized by photoinduced force microscopy (Conference Presentation)", Proc. SPIE 10350, Nanoimaging and Nanospectroscopy V, 103500T (21 September 2017); https://doi.org/10.1117/12.2273091

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available

Members: $17.00

Non-members: $21.00 ADD TO CART

PROCEEDINGS
PRESENTATION

WATCH
PRESENTATION SAVE TO MY LIBRARY

GET CITATION

KEYWORDS

Magnetism

Microscopy

Near field scanning optical microscopy

Super resolution

Distortion

Medical research

Near field optics

Show All Keywords

Keywords/Phrases

Search In:

Publication Years