Paper
18 November 1989 A Simple And Low Cost 3-Probe Measurement Technique Using Microstrip Circuits
Kai Chang, Ming-Yi Li, Thomas Sauter
Author Affiliations +
Proceedings Volume 1039, 13th Intl Conf on Infrared and Millimeter Waves; (1989) https://doi.org/10.1117/12.978500
Event: 13th International Conference on Infrared and Millimeter Waves, 1987, Honolulu, HI, United States
Abstract
A simple and low cost measurement system using 3-probe microstrip circuits has been developed for impedance and S-parameter measurements. The coupling coefficients for the three probes can be unequal and only one power meter is required. The measured results agree very well with those obtained from an HP 8510 automatic network analyzer.
© (1989) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Kai Chang, Ming-Yi Li, and Thomas Sauter "A Simple And Low Cost 3-Probe Measurement Technique Using Microstrip Circuits", Proc. SPIE 1039, 13th Intl Conf on Infrared and Millimeter Waves, (18 November 1989); https://doi.org/10.1117/12.978500
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KEYWORDS
Calibration

Network security

Power meters

Electrical engineering

Fourier transforms

Lithium

Switches

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