Thin film sensing by metal-insulator-metal plasmonic structures

S. Refki; Y. Elidrissi; N. Andam; S. Hayashi; Z. Sekkat

doi:10.1117/12.2622229

31 May 2022 Thin film sensing by metal-insulator-metal plasmonic structures

S. Refki, Y. Elidrissi, N. Andam, S. Hayashi, Z. Sekkat

Proceedings Volume 12145, Biophotonics in Point-of-Care II; 1214504 (2022) https://doi.org/10.1117/12.2622229
Event: SPIE Photonics Europe, 2022, Strasbourg, France

Abstract

Optical sensors based on a plasmonic multilayer stack, such as metal-insulator-metal (MIM), have attracted considerable attention over the past decades owing to their high resolution and high performance compared to conventional surface plasmon resonance (CSPR) sensors for bulk sensing (BS) applications. In this paper we show that CSPR is better than MIM sensors for thin film sensing, i.e. when a dielectric sensing layer (SL) is deposited on the outermost metal layer of the structure. We demonstrate that the deposition of a thin film SL on the top of the outermost-layer of an optimized multilayer structure, i.e. MIM, strongly decreases the evanescent electric field and the field enhancement at metal-SL interface and decreases the sensor’s sensitivity for MIM versus CSPR. By considering the theoretical and experimental results we demonstrated that CSPR is more suitable than MIM for thin films sensing applications.

Citation Download Citation

S. Refki, Y. Elidrissi, N. Andam, S. Hayashi, and Z. Sekkat "Thin film sensing by metal-insulator-metal plasmonic structures", Proc. SPIE 12145, Biophotonics in Point-of-Care II, 1214504 (31 May 2022); https://doi.org/10.1117/12.2622229

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KEYWORDS

Sensors

Polymethylmethacrylate

Silver

Thin films

Reflectivity

Molecules

Plasmonics

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