Paper
1 August 1990 Approach to the development of CAD/CAM system for multilayer optical coatings
G. R. Mohan Rao, C. L. Nagendra, G. K. M. Thutupalli
Author Affiliations +
Proceedings Volume 1270, Optical Thin Films and Applications; (1990) https://doi.org/10.1117/12.20364
Event: The International Congress on Optical Science and Engineering, 1990, The Hague, Netherlands
Abstract
CADCAM system is very vital in the development and production of high efficiency optical coatings, in which in-situ analysis and optiniizatfrxi is the nucleus. A new algoritlin for in-situ analysis and optimization of coatings has been proposed, which has provision for precise determination of optical parameters, namely refractive index n, and gearetrical thickness d, of any layer :tt the multilayered configuration and, to account for adverse effect of the deviaticxs in the optical pareters through global re-optimization of the coatings. It has been implemented on 8086/8087 microprocessor systn in which 8086 is a 16 bit microprocessor and 8087, a coprocessor for high speed floating point operatixs. The validity of the algorithn has been established through a wide range of hypothetical case studies and experimental deve1opint of a few coatings such as wideband antireflecticx coatings (ARCs).
© (1990) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
G. R. Mohan Rao, C. L. Nagendra, and G. K. M. Thutupalli "Approach to the development of CAD/CAM system for multilayer optical coatings", Proc. SPIE 1270, Optical Thin Films and Applications, (1 August 1990); https://doi.org/10.1117/12.20364
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KEYWORDS
Optical coatings

Thin films

Refractive index

Multilayers

Reflectivity

Thin film coatings

Error analysis

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