Paper
20 April 1998 Fullerene-embedded Langmuir-Blodgett films probed by spectroscopic ellipsometry
Eugene G. Bortchagovsky, Igor A. Yurchenko, Zoya I. Kazantseva, Josef Humlicek, Jaroslav Hora
Author Affiliations +
Proceedings Volume 3359, Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics 1997; (1998) https://doi.org/10.1117/12.306243
Event: International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics, 1997, Kiev, Ukraine
Abstract
This work presents the first results of ellipsometric investigation of fullerene embedded Langmuir-Blodgett films on gold with surface plasmon excitation. In contrast to the standard ellipsometry, the spectrum of the delta angle obtained in such way has pronounced peculiarities at the C60 optical transitions. Obtained data unambiguous exhibit dependence of electromagnetic response of the system of interest on the proximity of fullerene to the gold surface.
© (1998) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Eugene G. Bortchagovsky, Igor A. Yurchenko, Zoya I. Kazantseva, Josef Humlicek, and Jaroslav Hora "Fullerene-embedded Langmuir-Blodgett films probed by spectroscopic ellipsometry", Proc. SPIE 3359, Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics 1997, (20 April 1998); https://doi.org/10.1117/12.306243
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KEYWORDS
Gold

Fullerenes

Ellipsometry

Surface plasmons

Dielectrics

Optical properties

Data modeling

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