New method for the recovery of the refractive-index profile of an optical waveguide from the measured coupling angles

Qing Liu; Zhuangqi Cao; Qishun Shen; Xiaoming Dou; Yingli Chen; Yukihiro Ozaki

doi:10.1117/12.402603

9 October 2000 New method for the recovery of the refractive-index profile of an optical waveguide from the measured coupling angles

Qing Liu, Zhuangqi Cao, Qishun Shen, Xiaoming Dou, Yingli Chen, Yukihiro Ozaki

Author Affiliations +

Proceedings Volume 4221, Optical Measurement and Nondestructive Testing: Techniques and Applications; (2000) https://doi.org/10.1117/12.402603
Event: Optics and Optoelectronic Inspection and Control: Techniques, Applications, and Instruments, 2000, Beijing, China

Abstract

In this paper, we present a new method used for the recovery of the refractive-index profile of an optical waveguide from the measured coupling angles. Two improvements have been made in our method. First, we determine the surface refractive index of the inhomogeneous waveguide by experiment technique, instead of usual numerical methods. Second, we present a new fitting criterion which is based on the accurate ATMM (Analytic Transfer Matrix Method), but not approximate WKB theory. Experimental results demonstrate our method could give better results compared with the previous techniques.

Citation Download Citation

Qing Liu, Zhuangqi Cao, Qishun Shen, Xiaoming Dou, Yingli Chen, and Yukihiro Ozaki "New method for the recovery of the refractive-index profile of an optical waveguide from the measured coupling angles", Proc. SPIE 4221, Optical Measurement and Nondestructive Testing: Techniques and Applications, (9 October 2000); https://doi.org/10.1117/12.402603

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