Characterization of the near-surface region in ion-exchanged glass waveguides

Flavio Horowitz; Marcelo Barbalho Pereira; M. Behar; Luiz Carlos Barbosa; Stefano Pelli; Giancarlo C. Righini

doi:10.1117/12.426786

15 May 2001 Characterization of the near-surface region in ion-exchanged glass waveguides

Flavio Horowitz, Marcelo Barbalho Pereira, M. Behar, Luiz Carlos Barbosa, Stefano Pelli, Giancarlo C. Righini

Proceedings Volume 4277, Integrated Optics Devices V; (2001) https://doi.org/10.1117/12.426786
Event: Symposium on Integrated Optics, 2001, San Jose, CA, United States

Abstract

In the characterization of graded-index glass waveguides, use of the standard m-line method by several laboratories has produced increasing discrepancies in the refractive index profile with decreasing film depth. We have addressed this very critical problem by a direct near-surface (DNS) approach, where the polarimetric Abeles-Hacskaylo method was extended as an admittance-matching condition for inhomogeneous films. In this paper, we review the measurement procedures of the same Ag⁺-exchanged waveguides by the DNS approach and by the m-line method, whose result showed significant disagreement at the film-air interface. We search the underlying reasons for this disagreement and test them against non-optical measurements of the ion-concentration profile, to reach a better understanding of the near-surface region, as well as of the distinct probing range of the m-line and DNS techniques.

Citation Download Citation

Flavio Horowitz, Marcelo Barbalho Pereira, M. Behar, Luiz Carlos Barbosa, Stefano Pelli, and Giancarlo C. Righini "Characterization of the near-surface region in ion-exchanged glass waveguides", Proc. SPIE 4277, Integrated Optics Devices V, (15 May 2001); https://doi.org/10.1117/12.426786

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