Paper
12 June 2002 1.3-μm edge- and surface-emitting quantum dot lasers grown on GaAs substrates
Victor M. Ustinov, Alexey E. Zhukov, Nikolay A. Maleev, Anton Yu. Egorov, Alexey R. Kovsh, Sergei S. Mikhrin, Nikolai A. Cherkashin, Yuri M. Shernyakov, Mikhail V. Maximov, Anrei Tsatsul'nikov, Nikolai N. Ledentsov, Zhores I. Alferov, James A. Lott, Dieter Bimberg
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Abstract
The development of 1.3 micron VCSELs is currently considered to give a strong impulse for a wide use of ultra-fast local area networks. In the present work we discuss MBE growth and characteristics of InAs/GaAs quantum dot (QD) lasers, we also give characteristics of 1.3 micron QD VCSELs grown on GaAs and compare them with those of 1.3 micron InGaAsN/GaAs QW VCSELs. Overgrowing the InAs quantum dot array with thin InGaAs layer allows us to achieve 1.3 micron emission. Long stripe lasers showed low threshold current density (<100 A/cm2), high differential efficiency (>50%), and low internal loss (1-2 cm-1). Maximum continuous wave (CW) output power for wide stripe lasers was as high as 2.7 W and 110 mW for single mode devices. Uncoated broad area lasers showed no visible degradation of characteristics during 450 hours (60C, ambient environment). 1.3 micron InGaAsN/GaAs QW VCSELs are characterized by higher optical loss and lower differential efficiency than QD VCSELs. Due to high gain in the active region QW VCSELS demonstrate high output power (1 mW). QW VCSELs show extremely low internal round-trip optical loss (<0.05%), low threshold currents (<2 mA), high differential efficiency (40%) and output power (600 microW).
© (2002) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Victor M. Ustinov, Alexey E. Zhukov, Nikolay A. Maleev, Anton Yu. Egorov, Alexey R. Kovsh, Sergei S. Mikhrin, Nikolai A. Cherkashin, Yuri M. Shernyakov, Mikhail V. Maximov, Anrei Tsatsul'nikov, Nikolai N. Ledentsov, Zhores I. Alferov, James A. Lott, and Dieter Bimberg "1.3-μm edge- and surface-emitting quantum dot lasers grown on GaAs substrates", Proc. SPIE 4646, Physics and Simulation of Optoelectronic Devices X, (12 June 2002); https://doi.org/10.1117/12.470541
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KEYWORDS
Quantum wells

Vertical cavity surface emitting lasers

Quantum dots

Gallium arsenide

Laser damage threshold

Indium arsenide

Solids

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