Paper
21 July 2004 Nondestructive mechanical imaging of SnO2 nanobelts
Yuegui Zheng, Robert E. Geer
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Abstract
The relative surface contact stiffness of SnO2 nanobelts has been investigated via nondestructive ultrasonic force microscopy (UFM). The nanobelt crystal structure, as determined via transmission electron microscopy, was indexed to the tetragonal rutile structure (with lattice constants identical to those of bulk SnO2) as reported previously. The atomic Sn:O composition of the nanobelts studied was at or near 1:2. Topographic imaging studies revealed the nanobelt surface to be atomically flat with the exception of surface nano-dots, assumed to be local SnO2 crystallites. Preliminary local (10nm x 10nm) reduced modulus measurements were carried out via differential UFM on both the flat and nanodot regions of the nanobelt. Using the underlying Si substrate as a calibration standard the SnO2 modulus was estimated at 157±12 GPa, significantly lower than corresponding bulk values for any of the observed crystal orientations. We speculate this discrepancy is due in part to a combination of the aspherical probe tip and unknown adhesive properties of nanobelt, although an intrinsic reduction of the SnO2 nanobelt modulus cannot be ruled out.
© (2004) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Yuegui Zheng and Robert E. Geer "Nondestructive mechanical imaging of SnO2 nanobelts", Proc. SPIE 5392, Testing, Reliability, and Application of Micro- and Nano-Material Systems II, (21 July 2004); https://doi.org/10.1117/12.540411
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Cited by 2 scholarly publications.
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KEYWORDS
Silicon

Crystals

Ultrasonics

Calibration

Adhesives

Diffraction

Nondestructive evaluation

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