Paper
14 June 2006 Linear optics in the second-order characterization of thin films
Stefano Cattaneo, Katja Miettinen, Elina Vuorimaa, Aleksandre Efimov, Helge Lemmetyinen, Martti Kauranen
Author Affiliations +
Proceedings Volume 6259, ICONO 2005: Nonlinear Optical Phenomena; 62590K (2006) https://doi.org/10.1117/12.677882
Event: ICONO 2005, 2005, St. Petersburg, Russian Federation
Abstract
We study the importance of the linear optical properties of Langmuir-Blodgett films in their second-order nonlinear optical characterization. Second-harmonic generation with two noncollinear input beams is used to determine the susceptibility tensor of films of various thicknesses. In all cases, we find that the consistency of the results requires that the linear properties of the nonlinear layer be included in the model. While this is expected for the thickest films (~100 nm), our results show that the same holds also for a single Langmuir monolayer (~2,5 nm). Contrary to previous experiments on similar samples, we find that the linear response of a monolayer is well described by using the refractive index ofthick films of ~100 nm.
© (2006) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Stefano Cattaneo, Katja Miettinen, Elina Vuorimaa, Aleksandre Efimov, Helge Lemmetyinen, and Martti Kauranen "Linear optics in the second-order characterization of thin films", Proc. SPIE 6259, ICONO 2005: Nonlinear Optical Phenomena, 62590K (14 June 2006); https://doi.org/10.1117/12.677882
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Second-harmonic generation

Refractive index

Molecules

Optical properties

Data modeling

Thin films

Interfaces

Back to Top