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A primary source of "clutter" in sub-millimeter wave and terahertz imagery used in security applications is the random
reflections from clothing. In this paper, techniques for modeling and characterizing these reflections are described. This
work is motivated and, in part, based on previous work done in support of imaging radar for remote sensing. A first
order model of the response of a cloth covered object is described along with a method for performing measurements on
draped cloth. The measurement method involves the simultaneous measurement of the sub-millimeter wave response of
the cloth and the underlying drape of the cloth. A rigorous model of the scattering from draped cloth is developed and
compared with results from the first order model. Conclusions regarding the suitability of the first order model for
image simulation and performance predictions are stated.
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Eddie Jacobs, Steven Griffin, "Modeling and characterization of cloth at sub-millimeter wavelengths," Proc. SPIE 6549, Terahertz for Military and Security Applications V, 654904 (4 May 2007); https://doi.org/10.1117/12.718749