Study Of Surface Contamination By Surface Plasmons

D Y Song; F S Zhang; H A Macleod; M R Jacobson

doi:10.1117/12.939558

23 December 1986 Study Of Surface Contamination By Surface Plasmons

D Y Song, F S Zhang, H A Macleod, M R Jacobson

Proceedings Volume 0678, Optical Thin Films II: New Developments; (1986) https://doi.org/10.1117/12.939558
Event: 30th Annual Technical Symposium, 1986, San Diego, United States

Abstract

In the Kretschmann arrangement of coupling light into surface plasmon resonances, the base of a prism is coated with a metal film and the light is incident on that film internally. If the thickness of the film is correctly chosen, then light incident at particular angle will be coupled completely into the plasmons. Thus coupling leads to a narrow, deep dip in the internal reflectance of the prism base as a function of incidence angle. Any change in the character of the metal surface results in measurable changes in the incidence angles; thus, the phenomenon is an extremely sensitive indicator of surface conditions. In particular, the effect can detect and monitor very small amounts of surface contamination. The metal layer can also be overcoated with a thin dielectric layer, so that changes induced in contamination of the latter can be observed. The surface plasmon phenomenon and the experimental arrangement employed for contamination detection will be described; experimental results on residues left by strippable coatings will also be presented.

Citation Download Citation

D Y Song, F S Zhang, H A Macleod, and M R Jacobson "Study Of Surface Contamination By Surface Plasmons", Proc. SPIE 0678, Optical Thin Films II: New Developments, (23 December 1986); https://doi.org/10.1117/12.939558

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