Paper
20 January 2009 Understanding outside collaborations of the Chinese Academy of Sciences using Jensen-Shannon divergence
Author Affiliations +
Proceedings Volume 7243, Visualization and Data Analysis 2009; 72430C (2009) https://doi.org/10.1117/12.812383
Event: IS&T/SPIE Electronic Imaging, 2009, San Jose, California, United States
Abstract
Using Jensen-Shannon divergence to measure differences in collaboration patterns with outside collaborators makes it possible to understand the structure of those collaborations without direct information about how they collaborate with each other. Applying the approach to data on the outside collaborations of the Chinese Academy of Sciences and visualizing the results reveals interesting structure relevant for science policy decisions.
© (2009) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Russell Duhon "Understanding outside collaborations of the Chinese Academy of Sciences using Jensen-Shannon divergence", Proc. SPIE 7243, Visualization and Data Analysis 2009, 72430C (20 January 2009); https://doi.org/10.1117/12.812383
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CITATIONS
Cited by 2 scholarly publications.
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KEYWORDS
Information science

Information technology

Visualization

Associative arrays

Distance measurement

Information theory

Analytical research

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