Emission from dielectric materials at millimeter wavelengths in passive thermal environments

James C. Weatherall

doi:10.1117/12.849723

27 April 2010 Emission from dielectric materials at millimeter wavelengths in passive thermal environments

James C. Weatherall

Proceedings Volume 7670, Passive Millimeter-Wave Imaging Technology XIII; 76700F (2010) https://doi.org/10.1117/12.849723
Event: SPIE Defense, Security, and Sensing, 2010, Orlando, Florida, United States

Abstract

The brightness of radiation escaping a two-dimensional slab of material under ambient illumination is characterized in terms of its complex dielectric constant. Transmission and reflection coefficients derive from wave optics and the application of Beer's law; the emissivity follows from detailed balancing using Kirchoff's law. The solutions are compared with intensities measured with a commercial millimeter wave imaging system. The results show that millimeter wave imaging of semi-transparent materials can be described by optical physics based on dielectric material properties. In addition, analysis of millimeter wave images of materials could provide information about their dielectric properties.

Citation Download Citation

James C. Weatherall "Emission from dielectric materials at millimeter wavelengths in passive thermal environments", Proc. SPIE 7670, Passive Millimeter-Wave Imaging Technology XIII, 76700F (27 April 2010); https://doi.org/10.1117/12.849723

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