Sensitivity analysis of 1D and 2D photonic crystals sensors based on change of thickness and refractive index in material

Anil Kumar Mudraboyina; Jayshri Sabarinathan

doi:10.1117/12.905715

31 August 2011 Sensitivity analysis of 1D and 2D photonic crystals sensors based on change of thickness and refractive index in material

Anil Kumar Mudraboyina, Jayshri Sabarinathan

Author Affiliations +

Proceedings Volume 8007, Photonics North 2011; 800709 (2011) https://doi.org/10.1117/12.905715
Event: Photonics North 2011, 2011, Ottawa, Canada

Abstract

A detail study was done on the sensitivities of 1-D photonic crystal (PC) and 2-D PC coupled cavity sensors with changing sensing layer parameters of thickness and refractive index (RI). Though both refractive index and thickness are interrelated they have significant individual affects on device response. In 1-D PC shifts in normal transmission peak due to surface change in thickness and RI and in 2-D PC coupled cavity shifts in transmission dip due to surface changes are observed. Here sensitivity analysis in change in thickness and RI on these devices was done for four cases; case 1: change in thickness from 2nm-10nm on PC sensors, case 2: change in thickness from 75nm-175nm on PC sensors, case 3: change in RI in thin film (6nm) on surface and case 4: change in RI in thick film (100nm) on sensors surface. Sensitivities due to change in thickness (S_t) of 1-D PC and 2-D PC coupled cavity were calculated from the slope of the sensitivity curves and found to be (for RI of 1.4) 1.423nm/nm and 2.285nm/nm for case 1 and 0.455nm/nm and 0.801nm/nm for case 2. Sensitivities due to change in RI (S_r) of 1-D PC and 2-D PC coupled cavity were obtained from the transmission peak and dip shifts due to change in RI from 1(air) to 2. Sr for 1-D PC and 2-D PC coupled cavity were found to be 70nm/RIU and 103nm/RIU for case 3 and 143nm/RIU and 213nm/RIU for case 4. The results are based on FDTD simulations.

Citation Download Citation

Anil Kumar Mudraboyina and Jayshri Sabarinathan "Sensitivity analysis of 1D and 2D photonic crystals sensors based on change of thickness and refractive index in material", Proc. SPIE 8007, Photonics North 2011, 800709 (31 August 2011); https://doi.org/10.1117/12.905715

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available

Members: $17.00

Non-members: $21.00 ADD TO CART

PROCEEDINGS
7 PAGES

DOWNLOAD PAPER SAVE TO MY LIBRARY

GET CITATION

RIGHTS & PERMISSIONS

Get copyright permission Get copyright permission on Copyright Marketplace

KEYWORDS

Sensors

Photonic crystals

Refractive index

Silicon

Finite-difference time-domain method

Thin films

Computer aided design

Show All Keywords

Keywords/Phrases

Search In:

Publication Years