Effect of surface roughness on subwavelength imaging with layered metamaterial optical elements

T. Stefaniuk; G. Nowak; R. Kotynski

doi:10.1117/12.889188

18 May 2011 Effect of surface roughness on subwavelength imaging with layered metamaterial optical elements

T. Stefaniuk, G. Nowak, R. Kotynski

Proceedings Volume 8070, Metamaterials VI; 807010 (2011) https://doi.org/10.1117/12.889188
Event: SPIE Optics + Optoelectronics, 2011, Prague, Czech Republic

Abstract

We characterize the influence of surface roughness on resolution and on the transmission coefficient of double layered silver-TiO2 superlenses. Rough surfaces are modelled with a Gaussian statistics based on experimental AFM measurements of e-beam evaporated layers, whereas the rest of the analysis is numerical and is obtained using 2D FDTD. The roughness of a surface is described with the root-mean-square of its height and with the width of its autocorrelation function. Our modelling results confirm that surface roughness is a critical limiting factor for both superresolution and for large transmission efficiency.

Citation Download Citation

T. Stefaniuk, G. Nowak, and R. Kotynski "Effect of surface roughness on subwavelength imaging with layered metamaterial optical elements", Proc. SPIE 8070, Metamaterials VI, 807010 (18 May 2011); https://doi.org/10.1117/12.889188

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