Paper
19 March 2012 Investigation of correlation with the octanol water partition coefficient and the sensitivity of negative-tone molecular resists
Masatoshi Echigo, Masako Yamakawa, Yumi Ochiai, Yu Okada, Masaaki Takasuka
Author Affiliations +
Abstract
In this paper, we report the investigation of correlation with the octanol water partition coefficient and the sensitivity of negative-tone molecular resists based on calix[4]resorcinarene (CRA) by Electron Beam Lithography (EBL). The sensitivity of negative-tone molecular resists were higher as the value of the Octanol water partition coefficient got smaller. It was confirmed that the octanol water partition coefficient was useful to the guess of sensitivity of negativetone molecular resists. Furthermore, we have developed calix[4]resorcinarenes showing well-defined sub 20nm halfpitch patterns.
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Masatoshi Echigo, Masako Yamakawa, Yumi Ochiai, Yu Okada, and Masaaki Takasuka "Investigation of correlation with the octanol water partition coefficient and the sensitivity of negative-tone molecular resists", Proc. SPIE 8325, Advances in Resist Materials and Processing Technology XXIX, 83251G (19 March 2012); https://doi.org/10.1117/12.916145
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KEYWORDS
Industrial chemicals

Electron beam lithography

Semiconducting wafers

Extreme ultraviolet lithography

Bioalcohols

Scanning electron microscopy

Silicon

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