Lensless single-exposure super-resolved interferometric microscopy

Luis Granero; Carlos Ferreira; Javier García; Vicente Micó

doi:10.1117/12.2020580

13 May 2013 Lensless single-exposure super-resolved interferometric microscopy

Luis Granero, Carlos Ferreira, Javier García, Vicente Micó

Proceedings Volume 8788, Optical Measurement Systems for Industrial Inspection VIII; 878808 (2013) https://doi.org/10.1117/12.2020580
Event: SPIE Optical Metrology 2013, 2013, Munich, Germany

Abstract

Single Exposure Super Resolved Interferometric Microscopy (SESRIM) has been recently proposed as a way to achieve one dimensional super resolved imaging in digital holographic microscopy. SESRIM uses Red-Green-Blue (RGB) multiplexing for illuminating the sample having different propagation angles for each one of the three illumination wavelengths and it has been experimentally validated considering color (A. Calabuig, V. Mico, J. Garcia, Z. Zalevsky, and C. Ferreira, “Single-exposure super-resolved interferometric microscopy by red–green–blue multiplexing,” Opt. Lett. 36, 885-887, 2011) and monochrome (A. Calabuig, J. Garcia, C. Ferreira, Z. Zalevsky, and V. Mico, “Resolution improvement by single-exposure superresolved interferometric microscopy with a monochrome sensor,” J. Opt. Soc. Am. A 28, 2346-2358, 2011) digital sensors for holographic recording. In this contribution, we will first review some of the characteristics of the previously reported SESRIM approaches and second, we will present preliminary results for the extension of SESRIM to the field of lensless holographic microscopy. Experimental results are reported validating this new kind of superresolution imaging method named as lensless SESRIM (L-SESRIM).

Citation Download Citation

Luis Granero, Carlos Ferreira, Javier García, and Vicente Micó "Lensless single-exposure super-resolved interferometric microscopy", Proc. SPIE 8788, Optical Measurement Systems for Industrial Inspection VIII, 878808 (13 May 2013); https://doi.org/10.1117/12.2020580

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