Characterization and modeling tools for light management in heterogeneous thin film layers

J. Le Rouzo; D. Duché; C. M. Ruiz; F. Thierry; M. Carlberg; G. Berginc; M. Pasquinelli; J.-J. Simon; L. Escoubas; F. Flory

doi:10.1117/12.2237682

26 September 2016 Characterization and modeling tools for light management in heterogeneous thin film layers

J. Le Rouzo, D. Duché, C. M. Ruiz, F. Thierry, M. Carlberg, G. Berginc, M. Pasquinelli, J.-J. Simon, L. Escoubas, F. Flory

Author Affiliations +

Proceedings Volume 9929, Nanostructured Thin Films IX; 99290I (2016) https://doi.org/10.1117/12.2237682
Event: SPIE Nanoscience + Engineering, 2016, San Diego, California, United States

Abstract

The extraordinary progresses in the design and realization of structures in inorganic or organic thin films, whether or not including nanoparticles, make it possible to develop devices with very specific properties. Mastering the links between the macroscopic optical properties and the opto-geometrical parameters of these heterogeneous layers is thus a crucial issue. We propose to present the tools used to characterize and to model thin film layers, from an optical point of view, highlighting the interest of coupling both experimental and simulation studies for improving our knowledge on the optical response of the structure. Different examples of studies are presented on CIGS, Perovskite, P3HT:ZnO, PC70BM, organic layer containing metallic nanoparticles and colored solar cells.

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J. Le Rouzo, D. Duché, C. M. Ruiz, F. Thierry, M. Carlberg, G. Berginc, M. Pasquinelli, J.-J. Simon, L. Escoubas, and F. Flory "Characterization and modeling tools for light management in heterogeneous thin film layers", Proc. SPIE 9929, Nanostructured Thin Films IX, 99290I (26 September 2016); https://doi.org/10.1117/12.2237682

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