Presentation
16 March 2023 Tin/gallium oxide alloying probed using X-ray microanalysis and cathodoluminescence (Conference Presentation)
Daniel Hunter, Naresh-Kumar Gunasekar, Paul R. Edwards, Fabien Massabuau, Isa Hatipoglu, Partha Mukhopadhyay, Winston V. Schoenfeld, Robert W. Martin
Author Affiliations +
Proceedings Volume PC12422, Oxide-based Materials and Devices XIV; PC124220C (2023) https://doi.org/10.1117/12.2655959
Event: SPIE OPTO, 2023, San Francisco, California, United States
Abstract
Tin-gallium oxide (TGO) epilayers have been characterized through the electron microscopy techniques of wavelength-dispersive X-ray spectroscopy (WDX) and cathodoluminescence. Tin incorporation was found to be highly dependent on growth conditions with (0001)-sapphire and (010)-Ga2O3 substrates enhancing tin incorporation. Cathodoluminescence measurements show that TGO luminescence consists of an enhanced blue emission and quenched UV when compared to Ga2O3.and the onset of new green emission originating from the TGO, further correlated through cross-sectional WDX and cathodoluminescence mapping. As well as luminescence intensity changes TGO films display redshifted luminescence bands associated with a bandgap reduction due to the alloying, confirmed through optical transmission measurements.
Conference Presentation
© (2023) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Daniel Hunter, Naresh-Kumar Gunasekar, Paul R. Edwards, Fabien Massabuau, Isa Hatipoglu, Partha Mukhopadhyay, Winston V. Schoenfeld, and Robert W. Martin "Tin/gallium oxide alloying probed using X-ray microanalysis and cathodoluminescence (Conference Presentation)", Proc. SPIE PC12422, Oxide-based Materials and Devices XIV, PC124220C (16 March 2023); https://doi.org/10.1117/12.2655959
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KEYWORDS
Tin

Oxides

X-rays

Ultraviolet radiation

Patterned sapphire substrate

Ranging

Sapphire

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