Open Access
14 February 2014 Publisher’s note: Tunable stoichiometry of BCxNy thin films through multitarget pulsed laser deposition monitored via in situ ellipsometry
John G. Jones, Lirong Sun, Neil R. Murphy, Tyson C. Back, Matthew A. Lange, Jessica L. Remmert, Paul T. Murray
Author Affiliations +
Abstract
This article [J. Nanophoton.. 8, (1 ), 083890 ( Feb 5 , 2014)] mistakenly appeared in the Special Section on Metamaterials and Photonic Nanostructures. It was republished in the Special Section on Nanostructured Thin Films VI with a corrected CID on 10 February 2014. The updated citation is shown below:

This article [J. Nanophoton. 8(1), 083890 (Feb 5, 2014)] mistakenly appeared in the Special Section on Metamaterials and Photonic Nanostructures. It was republished in the Special Section on Nanostructured Thin Films VI with a corrected CID on 10 February 2014. The updated citation is shown below:

J. G. Joneset al., “Tunable stoichiometry of BCxNy thin films through multitarget pulsed laser deposition monitored via in situ ellipsometry,” J. Nanophoton. 8, 083999 (2014).

© The Authors. Published by SPIE under a Creative Commons Attribution 3.0 Unported License. Distribution or reproduction of this work in whole or in part requires full attribution of the original publication, including its DOI.
John G. Jones, Lirong Sun, Neil R. Murphy, Tyson C. Back, Matthew A. Lange, Jessica L. Remmert, and Paul T. Murray "Publisher’s note: Tunable stoichiometry of BCxNy thin films through multitarget pulsed laser deposition monitored via in situ ellipsometry," Journal of Nanophotonics 8(1), 089999 (14 February 2014). https://doi.org/10.1117/1.JNP.8.089999
Published: 14 February 2014
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KEYWORDS
Ellipsometry

Pulsed laser deposition

Thin films

Metamaterials

Nanostructured thin films

Photonic nanostructures

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