In this paper, the impacts of surface plasmon resonance (SPR) on the angular spin splitting of light are investigated theoretically. The expression for the angular spin splitting shifts is derived, and the angular shifts as the function of the angle of incidence under different metal film thicknesses are calculated. The simulation results manifest that the angular spin splitting is significantly enhanced when surface plasmons are strongly excited. Under the optimal parameter conditions, the largest angular shift is up to 4.493×10-5 rad. It is also found that the directions of spatial propagation of photons in the out-of-plane can be switched by adjusting the angle of incidence under certain conditions. These findings may provide a new way for photon manipulation and open another possibility for the development of new nano-photonic devices.
In this letter, we theoretically investigate the impact of the incident light polarization on photonic spin splitting induced by the photonic spin Hall effect when a linearly polarized Gaussian beam is reflected from an air-glass interface around the Brewster angle. We calculate the spin splitting shift as a function of the incident light polarization under different incident angles. We find that a tiny variation of the incident light polarization can result in a dramatic change of the spin splitting shift, and the highest sensitivity is up to 6.8 μm/deg . The largest splitting shift can reach 5.3 μm, which is larger than the previously reported values. We also find that the direction of spin accumulation of photons with different spin directions can be switched by adjusting the incident angle around the Brewster angle when the incident light polarization is near the p-polarization. These findings may be useful for precise polarization metrology and photon modulation.
A mathematic model based on surface plasmon resonance (SPR) effect is presented to measure the nano metallic film
thickness with the coupling device of Kretschmann configuration composed of K9 prism-gold film-air. Four modulation
modes of SPR method, such as intensity, phase, wavelength and angle, are numerically analyzed. Their detection
principles, the measurement range and sensitivity of different modulation type sensors are discussed. The simulation
results show that the SPR intensity detection method has the highest measurement range and the SPR phase detection
method has the highest sensitivity. In practical applications, not only the measurement range and sensitivity, but the
optical signal processing mode, experiment devices, the complexity of the algorithm and cost factors should be
considered to research and develop the appropriate thin metallic film's thickness measurement SPR sensor with higher
sensitivity and stability.
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