PROCEEDINGS VOLUME 2423
IS&T/SPIE'S SYMPOSIUM ON ELECTRONIC IMAGING: SCIENCE AND TECHNOLOGY | 5-10 FEBRUARY 1995
Machine Vision Applications in Industrial Inspection III
Editor(s): Frederick Y. Wu, Stephen S. Wilson
Editor Affiliations +
IS&T/SPIE'S SYMPOSIUM ON ELECTRONIC IMAGING: SCIENCE AND TECHNOLOGY
5-10 February 1995
San Jose, CA, United States
Electronics Inspection
Arthur J. Na, Dongming Zhao, Malayappan Shridhar
Proceedings Volume Machine Vision Applications in Industrial Inspection III, (1995) https://doi.org/10.1117/12.205496
Ahti A. Hujanen, Frederick M. Waltz
Proceedings Volume Machine Vision Applications in Industrial Inspection III, (1995) https://doi.org/10.1117/12.205505
V. B. Blaignan, Nikolaos G. Bourbakis, Ali Moghaddamzadeh, Evangelos A. Yfantis
Proceedings Volume Machine Vision Applications in Industrial Inspection III, (1995) https://doi.org/10.1117/12.205516
Jerry M. Bowskill, T. Katz, J. H. Downie
Proceedings Volume Machine Vision Applications in Industrial Inspection III, (1995) https://doi.org/10.1117/12.205524
Paul A. Roder
Proceedings Volume Machine Vision Applications in Industrial Inspection III, (1995) https://doi.org/10.1117/12.205525
Robot Vision/Tracking
Marcello Ricotti, A. Liotta
Proceedings Volume Machine Vision Applications in Industrial Inspection III, (1995) https://doi.org/10.1117/12.205526
Eun-Soo Kim, Kwang-Hoon Cha, Hoon-Gee Yang
Proceedings Volume Machine Vision Applications in Industrial Inspection III, (1995) https://doi.org/10.1117/12.205527
Uwe Weller, Stefan Reinschmidt
Proceedings Volume Machine Vision Applications in Industrial Inspection III, (1995) https://doi.org/10.1117/12.205528
Chao Chen, Masayuki Nakajima
Proceedings Volume Machine Vision Applications in Industrial Inspection III, (1995) https://doi.org/10.1117/12.205529
3D Inspection/Recognition
Kjersti Aas, Line Eikvil, Dag Bremnes, Andreas Norbryhn
Proceedings Volume Machine Vision Applications in Industrial Inspection III, (1995) https://doi.org/10.1117/12.205497
Chihhsiong Stone Shih, Lester A. Gerhardt
Proceedings Volume Machine Vision Applications in Industrial Inspection III, (1995) https://doi.org/10.1117/12.205498
Proceedings Volume Machine Vision Applications in Industrial Inspection III, (1995) https://doi.org/10.1117/12.205499
Joan Marti, Toni Verdu, Joan Batlle
Proceedings Volume Machine Vision Applications in Industrial Inspection III, (1995) https://doi.org/10.1117/12.205500
Grier C. I. Lin, Tien-Fu Lu, Dayong Zhang
Proceedings Volume Machine Vision Applications in Industrial Inspection III, (1995) https://doi.org/10.1117/12.205501
3D Imaging/Preprocessing
Erik Astrand, Mattias Johannesson, Anders Astrom
Proceedings Volume Machine Vision Applications in Industrial Inspection III, (1995) https://doi.org/10.1117/12.205502
W. Thomas Cathey, Edward R. Dowski Jr.
Proceedings Volume Machine Vision Applications in Industrial Inspection III, (1995) https://doi.org/10.1117/12.205503
Proceedings Volume Machine Vision Applications in Industrial Inspection III, (1995) https://doi.org/10.1117/12.205504
Object Recognition/Classification
Bento A. Brazio Correia, Jeronimo Araujo Silva, Fernando D. Carvalho, Rui Guilherme, Fernando Carvalho Rodrigues, Antonio M.E. de Silva Ferreira
Proceedings Volume Machine Vision Applications in Industrial Inspection III, (1995) https://doi.org/10.1117/12.205506
Hannu Kauppinen, Olli Silven
Proceedings Volume Machine Vision Applications in Industrial Inspection III, (1995) https://doi.org/10.1117/12.205507
Stephen A. Jones, G. J. Awcock, R. L. Thomas, Kurt Humphrey
Proceedings Volume Machine Vision Applications in Industrial Inspection III, (1995) https://doi.org/10.1117/12.205508
Koichi Arimura, Norihiro Hagita
Proceedings Volume Machine Vision Applications in Industrial Inspection III, (1995) https://doi.org/10.1117/12.205509
Texture Classification
Antonella Branca, Oronzo Quarta, William Delaney, Arcangelo Distante
Proceedings Volume Machine Vision Applications in Industrial Inspection III, (1995) https://doi.org/10.1117/12.205510
Constantinos Boukouvalas, Josef Kittler, R. Marik, Maria Petrou
Proceedings Volume Machine Vision Applications in Industrial Inspection III, (1995) https://doi.org/10.1117/12.205511
Proceedings Volume Machine Vision Applications in Industrial Inspection III, (1995) https://doi.org/10.1117/12.205512
Dragana P. Brzakovic, Nenad S. Vujovic, A. Liakopoulos
Proceedings Volume Machine Vision Applications in Industrial Inspection III, (1995) https://doi.org/10.1117/12.205513
Defect Classification
Yonghong Tang, Aiqun Niu, William G. Wee, Chia Yung Han
Proceedings Volume Machine Vision Applications in Industrial Inspection III, (1995) https://doi.org/10.1117/12.205514
Boon Kwei Wong, M. Paul Elliot, C. W. Rapley
Proceedings Volume Machine Vision Applications in Industrial Inspection III, (1995) https://doi.org/10.1117/12.205515
Nathalie Combier, Isabelle Dauty, Jacques Lemoine
Proceedings Volume Machine Vision Applications in Industrial Inspection III, (1995) https://doi.org/10.1117/12.205517
Web Inspection
Christopher Sanby, Leonard Norton-Wayne
Proceedings Volume Machine Vision Applications in Industrial Inspection III, (1995) https://doi.org/10.1117/12.205518
Nasser Sherkat, Chi-Hsien Victor Shih, Peter D. Thomas
Proceedings Volume Machine Vision Applications in Industrial Inspection III, (1995) https://doi.org/10.1117/12.205519
Mark Bradshaw
Proceedings Volume Machine Vision Applications in Industrial Inspection III, (1995) https://doi.org/10.1117/12.205520
Calibration/Verification
Yi Wang, Nagaraj Nandhakumar, Worthy N. Martin
Proceedings Volume Machine Vision Applications in Industrial Inspection III, (1995) https://doi.org/10.1117/12.205521
Robert Sablatnig, C. Hansen
Proceedings Volume Machine Vision Applications in Industrial Inspection III, (1995) https://doi.org/10.1117/12.205522
Ming-Yuan Liu, Dong-Wen Wang, Hao Shi
Proceedings Volume Machine Vision Applications in Industrial Inspection III, (1995) https://doi.org/10.1117/12.205523
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