PROCEEDINGS VOLUME 4223
OPTICS AND OPTOELECTRONIC INSPECTION AND CONTROL: TECHNIQUES, APPLICATIONS, AND INSTRUMENTS | 8-10 NOVEMBER 2000
Instruments for Optics and Optoelectronic Inspection and Control
Editor(s): Guang Hui Wei, Sheng Liu
Editor Affiliations +
IN THIS VOLUME

1 Sessions, 62 Papers, 0 Presentations
Papers  (62)
OPTICS AND OPTOELECTRONIC INSPECTION AND CONTROL: TECHNIQUES, APPLICATIONS, AND INSTRUMENTS
8-10 November 2000
Beijing, China
Papers
Su Hui Yang, Ke Ying Wu, Chang Ming Zhao, Guang Hui Wei
Proceedings Volume Instruments for Optics and Optoelectronic Inspection and Control, (2000) https://doi.org/10.1117/12.401747
Ke Ying Wu, Su Hui Yang, Chang Ming Zhao, Guang Hui Wei
Proceedings Volume Instruments for Optics and Optoelectronic Inspection and Control, (2000) https://doi.org/10.1117/12.401756
Jun He, HongJie Xu, BingKun Qin
Proceedings Volume Instruments for Optics and Optoelectronic Inspection and Control, (2000) https://doi.org/10.1117/12.401763
Lei Fu, Hongmin Shi, Shouyong Ni, Yaodong Lu, Lingxiang Zhang, Jianguo Xin
Proceedings Volume Instruments for Optics and Optoelectronic Inspection and Control, (2000) https://doi.org/10.1117/12.401770
Yi He, Jixiang Yan, Jiaze Li, Jie Liu, Changqing Yu
Proceedings Volume Instruments for Optics and Optoelectronic Inspection and Control, (2000) https://doi.org/10.1117/12.401779
Wenjiang Zhuo, Qin Li, Jialin Sun, Jianhua Xu, Jun Zhao, Jihua Guo
Proceedings Volume Instruments for Optics and Optoelectronic Inspection and Control, (2000) https://doi.org/10.1117/12.401792
Daoyi Wang, Guofan Jin, Yingbai Yan, Minxian Wu
Proceedings Volume Instruments for Optics and Optoelectronic Inspection and Control, (2000) https://doi.org/10.1117/12.401800
Deer Yi, Si Lu, Yingbai Yan, Guofan Jin
Proceedings Volume Instruments for Optics and Optoelectronic Inspection and Control, (2000) https://doi.org/10.1117/12.401808
Qibo Feng, Jinwen Liang
Proceedings Volume Instruments for Optics and Optoelectronic Inspection and Control, (2000) https://doi.org/10.1117/12.401748
Tiechuan Zuo, Tao Chen, Chengde Li
Proceedings Volume Instruments for Optics and Optoelectronic Inspection and Control, (2000) https://doi.org/10.1117/12.401749
Qiang Li, Hong Lei, Tiechuan Zuo
Proceedings Volume Instruments for Optics and Optoelectronic Inspection and Control, (2000) https://doi.org/10.1117/12.401750
Peihua Lu, Runwen Wang
Proceedings Volume Instruments for Optics and Optoelectronic Inspection and Control, (2000) https://doi.org/10.1117/12.401751
Xianfeng Chen, YuXing Xia, Shengwu Xie, Yuping Chen, Yingli Chen
Proceedings Volume Instruments for Optics and Optoelectronic Inspection and Control, (2000) https://doi.org/10.1117/12.401752
Guifu Ding, Xiaolin Zhao, Xiang Yao, Tianhui Shen
Proceedings Volume Instruments for Optics and Optoelectronic Inspection and Control, (2000) https://doi.org/10.1117/12.401753
Yuping Chen, Xianfeng Chen, Xianglong Zeng, Fei Wu, Lijun Chen, YiYun Wang, Shengwu Xie, YuXing Xia, Yingli Chen
Proceedings Volume Instruments for Optics and Optoelectronic Inspection and Control, (2000) https://doi.org/10.1117/12.401754
Limeng Wang, Yongsheng Wu, Xuhui Luo
Proceedings Volume Instruments for Optics and Optoelectronic Inspection and Control, (2000) https://doi.org/10.1117/12.401755
Shuqing Zhang, Jinshan Shi
Proceedings Volume Instruments for Optics and Optoelectronic Inspection and Control, (2000) https://doi.org/10.1117/12.401759
Proceedings Volume Instruments for Optics and Optoelectronic Inspection and Control, (2000) https://doi.org/10.1117/12.401760
Li Wang, Yu Zhao, Liu Huang
Proceedings Volume Instruments for Optics and Optoelectronic Inspection and Control, (2000) https://doi.org/10.1117/12.401761
Junliang Zhao, Rongfeng Guan, Hongtu Zhao
Proceedings Volume Instruments for Optics and Optoelectronic Inspection and Control, (2000) https://doi.org/10.1117/12.401762
Min Song, Yuxin Wang
Proceedings Volume Instruments for Optics and Optoelectronic Inspection and Control, (2000) https://doi.org/10.1117/12.401764
Proceedings Volume Instruments for Optics and Optoelectronic Inspection and Control, (2000) https://doi.org/10.1117/12.401765
Caihua Chen, Zhenwu Lu, Baochang Zhao
Proceedings Volume Instruments for Optics and Optoelectronic Inspection and Control, (2000) https://doi.org/10.1117/12.401766
Tongyu Wang, Huilin Jiang
Proceedings Volume Instruments for Optics and Optoelectronic Inspection and Control, (2000) https://doi.org/10.1117/12.401767
Tongyu Wang, Huilin Jiang
Proceedings Volume Instruments for Optics and Optoelectronic Inspection and Control, (2000) https://doi.org/10.1117/12.401768
Xuan Ming, Bin Chen, Zhi Liu
Proceedings Volume Instruments for Optics and Optoelectronic Inspection and Control, (2000) https://doi.org/10.1117/12.401769
Xiaoling Jia, Yundong Zhang, Yong Bi, Qi L. Wang, Zuguang Ma
Proceedings Volume Instruments for Optics and Optoelectronic Inspection and Control, (2000) https://doi.org/10.1117/12.401771
Yong Bi, Yundong Zhang, Xiaoling Jia, Qi L. Wang, Zuguang Ma
Proceedings Volume Instruments for Optics and Optoelectronic Inspection and Control, (2000) https://doi.org/10.1117/12.401772
Zhiquan Li, Lina Fan, Xifu Qiang
Proceedings Volume Instruments for Optics and Optoelectronic Inspection and Control, (2000) https://doi.org/10.1117/12.401773
Zhiquan Li, Zhibin Wang, Xuhui Tang, Xifu Qiang
Proceedings Volume Instruments for Optics and Optoelectronic Inspection and Control, (2000) https://doi.org/10.1117/12.401774
Proceedings Volume Instruments for Optics and Optoelectronic Inspection and Control, (2000) https://doi.org/10.1117/12.401775
Zhiquan Li, Chunling Fan, Lingshi Yao, Xifu Qiang
Proceedings Volume Instruments for Optics and Optoelectronic Inspection and Control, (2000) https://doi.org/10.1117/12.401776
Shaocheng Li, Qingxu Yu, Zhibin Chen, Junxiu Lin
Proceedings Volume Instruments for Optics and Optoelectronic Inspection and Control, (2000) https://doi.org/10.1117/12.401777
Proceedings Volume Instruments for Optics and Optoelectronic Inspection and Control, (2000) https://doi.org/10.1117/12.401778
Xiaodong Zeng, Shubin Wu, Yuying An
Proceedings Volume Instruments for Optics and Optoelectronic Inspection and Control, (2000) https://doi.org/10.1117/12.401780
Renxi Gong, Yimen Zhang, Shunxiang Shi, Tongyi Zhang
Proceedings Volume Instruments for Optics and Optoelectronic Inspection and Control, (2000) https://doi.org/10.1117/12.401781
Hui Guo, Vitaly Pravdivtsev
Proceedings Volume Instruments for Optics and Optoelectronic Inspection and Control, (2000) https://doi.org/10.1117/12.401782
Zhihong Liu, Dan Zhu, Wensheng Guo
Proceedings Volume Instruments for Optics and Optoelectronic Inspection and Control, (2000) https://doi.org/10.1117/12.401783
Huisong Jin, Youshen Lin, Shiyue Wang, Xin Lin
Proceedings Volume Instruments for Optics and Optoelectronic Inspection and Control, (2000) https://doi.org/10.1117/12.401784
Chun Lei, Baomin Zhang
Proceedings Volume Instruments for Optics and Optoelectronic Inspection and Control, (2000) https://doi.org/10.1117/12.401785
Lianfa Bai, Guohua Gu, Qian Chen, Baomin Zhang
Proceedings Volume Instruments for Optics and Optoelectronic Inspection and Control, (2000) https://doi.org/10.1117/12.401786
ZhongAn Liu
Proceedings Volume Instruments for Optics and Optoelectronic Inspection and Control, (2000) https://doi.org/10.1117/12.401787
ZhongAn Liu
Proceedings Volume Instruments for Optics and Optoelectronic Inspection and Control, (2000) https://doi.org/10.1117/12.401788
Jiwu Chen, Wei Wang, Zhineng Li
Proceedings Volume Instruments for Optics and Optoelectronic Inspection and Control, (2000) https://doi.org/10.1117/12.401789
Bing Ye, Yetai Fei, Yonghong Wang
Proceedings Volume Instruments for Optics and Optoelectronic Inspection and Control, (2000) https://doi.org/10.1117/12.401790
Ziyao Li, Jie Wei, Zhuhong Xia, Xuejun Gu, Liandi Zhang, Xianghe Kong, Haiyang Zheng, Bing Zhang
Proceedings Volume Instruments for Optics and Optoelectronic Inspection and Control, (2000) https://doi.org/10.1117/12.401791
Meiling Yuan, Qingnian Wang, Yuxin Zeng, Shuifeng Wang, Fei Xu, Guoan Cheng
Proceedings Volume Instruments for Optics and Optoelectronic Inspection and Control, (2000) https://doi.org/10.1117/12.401793
Proceedings Volume Instruments for Optics and Optoelectronic Inspection and Control, (2000) https://doi.org/10.1117/12.401794
Zhifeng Chen, Haibao Lu, Shaozong Zhang
Proceedings Volume Instruments for Optics and Optoelectronic Inspection and Control, (2000) https://doi.org/10.1117/12.401795
Shaojing Su, Zhiping Huang, Haibao Lu, Yimeng Zhang
Proceedings Volume Instruments for Optics and Optoelectronic Inspection and Control, (2000) https://doi.org/10.1117/12.401796
Qing Hua, Wenlong Zheng, Yuguang Li, Yinzhong Liang, Ping'an He, Song Li, Jing Xu
Proceedings Volume Instruments for Optics and Optoelectronic Inspection and Control, (2000) https://doi.org/10.1117/12.401797
Saixian He, Duiyan He, Sidong Zhong
Proceedings Volume Instruments for Optics and Optoelectronic Inspection and Control, (2000) https://doi.org/10.1117/12.401798
Saixian He, Sidong Zhong, Mozhi Yu
Proceedings Volume Instruments for Optics and Optoelectronic Inspection and Control, (2000) https://doi.org/10.1117/12.401799
Yan Sun, Guohua Cao, Li Li
Proceedings Volume Instruments for Optics and Optoelectronic Inspection and Control, (2000) https://doi.org/10.1117/12.401801
Yi Gao, Shu Gao
Proceedings Volume Instruments for Optics and Optoelectronic Inspection and Control, (2000) https://doi.org/10.1117/12.401802
Weina Liu, Ping Chen, Ling Chen
Proceedings Volume Instruments for Optics and Optoelectronic Inspection and Control, (2000) https://doi.org/10.1117/12.401803
Chunlin Tian, Jingfeng Fan, Weibing Wang, Xinming Zhang, Jiandong Yang
Proceedings Volume Instruments for Optics and Optoelectronic Inspection and Control, (2000) https://doi.org/10.1117/12.401804
Qiong Xie, Zhene Xu
Proceedings Volume Instruments for Optics and Optoelectronic Inspection and Control, (2000) https://doi.org/10.1117/12.401805
Ping Li, Xiaofeng Mu
Proceedings Volume Instruments for Optics and Optoelectronic Inspection and Control, (2000) https://doi.org/10.1117/12.401806
Songming Li, Rongpu Xu
Proceedings Volume Instruments for Optics and Optoelectronic Inspection and Control, (2000) https://doi.org/10.1117/12.401807
Min-Cheol Park, Seung-Woo Kim
Proceedings Volume Instruments for Optics and Optoelectronic Inspection and Control, (2000) https://doi.org/10.1117/12.401757
Alika Khare, P. Senthikumaran
Proceedings Volume Instruments for Optics and Optoelectronic Inspection and Control, (2000) https://doi.org/10.1117/12.401758
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