5 October 2023Chemical investigation of (bio)materials in ionic environment with scanning ion-conductance microscopy based tip-enhanced Raman spectroscopy
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Scanning ion-conductance microscopy (SICM) is a scanning probe imaging technique that specifically for studying samples under controlled liquid environments. With the advance in near-field optics, tip-enhanced Raman spectroscopy (TERS) combines the nanoscale spatial resolution imaging with the single-molecule chemical sensitivities of surface-enhanced Raman spectroscopy. Our goal is to translate the Ångström-scale spatial resolution of ultrahigh vacuum TERS to liquid environments. Therefore, we developed a SICM for TERS and applied it for interrogation of materials under ionic environments. We anticipate this new chemical imaging method will enable a more detailed understanding of soft biological and emerging energy materials in electrolyte solutions.
Naihao Chiang
"Chemical investigation of (bio)materials in ionic environment with scanning ion-conductance microscopy based tip-enhanced Raman spectroscopy", Proc. SPIE PC12654, Enhanced Spectroscopies and Nanoimaging 2023, PC126540S (5 October 2023); https://doi.org/10.1117/12.2676006
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Naihao Chiang, "Chemical investigation of (bio)materials in ionic environment with scanning ion-conductance microscopy based tip-enhanced Raman spectroscopy," Proc. SPIE PC12654, Enhanced Spectroscopies and Nanoimaging 2023, PC126540S (5 October 2023); https://doi.org/10.1117/12.2676006