Absorption-Interferometric Technique For Mapping Temperature And Concentration Profiles During Crystal Growth From Solution

Paul J. Shlichta

doi:10.1117/12.958992

15 May 1981 Absorption-Interferometric Technique For Mapping Temperature And Concentration Profiles During Crystal Growth From Solution

Paul J. Shlichta

Author Affiliations +

Proceedings Volume 0236, 1980 European Conf on Optical Systems and Applications; (1981) https://doi.org/10.1117/12.958992
Event: 1980 European Conference on Optical Systems and Applications, 1980, Utrecht, Netherlands

Abstract

Two-dimensional mapping of a solution's temperature and concentration profiles is possible in principle by pointwise combination of data from simultaneous absorption and interferometric images. Preliminary feasibility analysis and experiments indicate that adequate precision is attainable for selected solution crystallization systems.

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Paul J. Shlichta "Absorption-Interferometric Technique For Mapping Temperature And Concentration Profiles During Crystal Growth From Solution", Proc. SPIE 0236, 1980 European Conf on Optical Systems and Applications, (15 May 1981); https://doi.org/10.1117/12.958992

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