A New Optical Method For The Measurement Of Surface Roughness Of Technical Surfaces

R.-J. Ahlers; H. J. Warnecke

doi:10.1117/12.936342

15 November 1983 A New Optical Method For The Measurement Of Surface Roughness Of Technical Surfaces

R.-J. Ahlers, H. J. Warnecke

Proceedings Volume 0429, Precision Surface Metrology; (1983) https://doi.org/10.1117/12.936342
Event: 27th Annual Technical Symposium, 1983, San Diego, United States

Abstract

As the standards of quality of a product increase, so also does the importance of the roughness measurement of technical surfaces. In the near future the most important methods for on-line measurement will be those, that work on a non-tactile basis. In this report, a new optical method is presented and described from a more experimenta] point of view to emphasize the application-oriented development of this electro-optical measuring device. Beginning with some remarks on the more theoretical characteristics, experiment results will be presented that have been obtained from both standardized and technical surfaces. The results reveal the ability to measure surface roughness in the range of approximately Ra = 0,06-10 um.

Citation Download Citation

R.-J. Ahlers and H. J. Warnecke "A New Optical Method For The Measurement Of Surface Roughness Of Technical Surfaces", Proc. SPIE 0429, Precision Surface Metrology, (15 November 1983); https://doi.org/10.1117/12.936342

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