Limitations In Optical System Performance Due To Silicon PIN Photodiode Defects

S G Methley; J P Moss

doi:10.1117/12.943575

1 January 1987 Limitations In Optical System Performance Due To Silicon PIN Photodiode Defects

S G Methley, J P Moss

Proceedings Volume 0866, Materials and Technologies for Optical Communications; (1987) https://doi.org/10.1117/12.943575
Event: 1987 Symposium on the Technologies for Optoelectronics, 1987, Cannes, France

Abstract

Fundamental limitations in optical system performance are demonstrated to be caused by deficiencies in Si photodetector operation. Static electrical testing may identify groups of devices showing specific levels of digital optical line system performance. The mechanism is shown to be inherent in the Si-Si02 system, and sensitive to device structure.

Citation Download Citation

S G Methley and J P Moss "Limitations In Optical System Performance Due To Silicon PIN Photodiode Defects", Proc. SPIE 0866, Materials and Technologies for Optical Communications, (1 January 1987); https://doi.org/10.1117/12.943575

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