Virtual-stereo fringe reflection technique for specular free-form surface testing

Suodong Ma; Bo Li

doi:10.1117/12.2246220

24 November 2016 Virtual-stereo fringe reflection technique for specular free-form surface testing

Suodong Ma, Bo Li

Proceedings Volume 10023, Optical Metrology and Inspection for Industrial Applications IV; 100231S (2016) https://doi.org/10.1117/12.2246220
Event: SPIE/COS Photonics Asia, 2016, Beijing, China

Abstract

Due to their excellent ability to improve the performance of optical systems, free-form optics have attracted extensive interest in many fields, e.g. optical design of astronomical telescopes, laser beam expanders, spectral imagers, etc. However, compared with traditional simple ones, testing for such kind of optics is usually more complex and difficult which has been being a big barrier for the manufacture and the application of these optics. Fortunately, owing to the rapid development of electronic devices and computer vision technology, fringe reflection technique (FRT) with advantages of simple system structure, high measurement accuracy and large dynamic range is becoming a powerful tool for specular free-form surface testing. In order to obtain absolute surface shape distributions of test objects, two or more cameras are often required in the conventional FRT which makes the system structure more complex and the measurement cost much higher. Furthermore, high precision synchronization between each camera is also a troublesome issue. To overcome the aforementioned drawback, a virtual-stereo FRT for specular free-form surface testing is put forward in this paper. It is able to achieve absolute profiles with the help of only one single biprism and a camera meanwhile avoiding the problems of stereo FRT based on binocular or multi-ocular cameras. Preliminary experimental results demonstrate the feasibility of the proposed technique.

Citation Download Citation

Suodong Ma and Bo Li "Virtual-stereo fringe reflection technique for specular free-form surface testing", Proc. SPIE 10023, Optical Metrology and Inspection for Industrial Applications IV, 100231S (24 November 2016); https://doi.org/10.1117/12.2246220

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