Paper
21 March 1989 Printed Circuit Board Inspection System PI/1
Shiaw-Shian Yu, Wen-Chin Cheng, Chris S. C. Chiang
Author Affiliations +
Proceedings Volume 1004, Automated Inspection and High-Speed Vision Architectures II; (1989) https://doi.org/10.1117/12.948981
Event: 1988 Cambridge Symposium on Advances in Intelligent Robotics Systems, 1988, Boston, MA, United States
Abstract
An automatic printed circuit board (PCB) inspection system called PI/1, is described in this paper. The system can inspect PCB artwork and inner layers to find trace faults such as open circuits, short circuits, pin holes, fine lines and narrow line spaces. PI/1 uses a line scan camera with 1024 pixels resolution to take images. The whole image can be obtained by the help of a scanning mechanism in the X and the Y directions. Continuous pictures can be taken without blurring, and the resolution is between 1/2 to 2 mils. The inspection method used in PI/1 is a type of design rule checking. It does not require a reference image and can tolerate changes in the inspection environment due to illumination and PCB positioning. The inspection algorithm has been implemented into a special hardware and the inspection speed is about 4 x 106 pixels/sec.
© (1989) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Shiaw-Shian Yu, Wen-Chin Cheng, and Chris S. C. Chiang "Printed Circuit Board Inspection System PI/1", Proc. SPIE 1004, Automated Inspection and High-Speed Vision Architectures II, (21 March 1989); https://doi.org/10.1117/12.948981
Lens.org Logo
CITATIONS
Cited by 4 scholarly publications.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Inspection

Cameras

Copper

Image processing

Binary data

Electronics

Optical inspection

RELATED CONTENT

Novel methods for inspection of damage on airframes
Proceedings of SPIE (November 06 2018)
The State Of The Art In Printed Wiring Board Inspection
Proceedings of SPIE (December 04 1984)
Intelligent Visual Inspection Machines
Proceedings of SPIE (December 19 1985)
Automatic SMT Inspection With -X-Ray Vision
Proceedings of SPIE (March 12 1988)

Back to Top