Optical pulse waveform profiling through real-time stamping to corresponding characteristic spectra

Tsuyoshi Konishi; Yu Yamasaki; Tomotaka Nagashima

doi:10.1117/12.2256482

22 February 2017 Optical pulse waveform profiling through real-time stamping to corresponding characteristic spectra

Tsuyoshi Konishi, Yu Yamasaki, Tomotaka Nagashima

Proceedings Volume 10089, Real-time Measurements, Rogue Phenomena, and Single-Shot Applications II; 1008909 (2017) https://doi.org/10.1117/12.2256482
Event: SPIE LASE, 2017, San Francisco, California, United States

Abstract

We report an optical pulse profiling method which has a potential to enable real-time stamping of optical pulse waveforms to corresponding characteristic spectra without any user's expertise and skills. Its performance was confirmed by comparison with the conventional matured measurement tools and was as accurate as the conventional ones. The concept can be extended for real-time measurement of pulse-by-pulse phenomena provided the use of fast spectrum analyzers enables to acquire and storage pulse-by-pulse spectrum in real-time.

Conference Presentation

Citation Download Citation

Tsuyoshi Konishi, Yu Yamasaki, and Tomotaka Nagashima "Optical pulse waveform profiling through real-time stamping to corresponding characteristic spectra", Proc. SPIE 10089, Real-time Measurements, Rogue Phenomena, and Single-Shot Applications II, 1008909 (22 February 2017); https://doi.org/10.1117/12.2256482

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