Laser atomic fluorescence characterization of materials

Sergey B. Mirov; Alex Yu. Dergachev

doi:10.1117/12.279858

30 July 1997 Laser atomic fluorescence characterization of materials

Sergey B. Mirov, Alex Yu. Dergachev

Author Affiliations +

Proceedings Volume 10291, Materials Characterization and Optical Probe Techniques: A Critical Review; 1029108 (1997) https://doi.org/10.1117/12.279858
Event: Optical Science, Engineering and Instrumentation '97, 1997, San Diego, CA, United States

Abstract

Laser atomic fluorescence (LAF) is a powerful spectroscopic tool in analytical applications when it is necessary to measure extremely low concentrations of atoms. The main purpose of this method is to determine the presence and absolute concentrations of different elements in materials. In this paper we will describe the basic principles of the method and how advances in lasers, fiberoptics and detectors allow for significant improvement and simplification of the LAF spectrometer.

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Sergey B. Mirov and Alex Yu. Dergachev "Laser atomic fluorescence characterization of materials", Proc. SPIE 10291, Materials Characterization and Optical Probe Techniques: A Critical Review, 1029108 (30 July 1997); https://doi.org/10.1117/12.279858

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