Diffuser concepts for in-situ wavefront measurements of EUV projection optics

Mark van de Kerkhof; Robbert Jan Voogd; Ad Schasfoort; Evert Westerhuis; Wouter Engelen; Manfred Dikkers; Yassin Chowdhury; Michael Kriese; Stefan Bäumer; Uwe Zeitner; Torsten Feigl

doi:10.1117/12.2297433

19 March 2018 Diffuser concepts for in-situ wavefront measurements of EUV projection optics

Mark van de Kerkhof, Robbert Jan Voogd, Ad Schasfoort, Evert Westerhuis, Wouter Engelen, Manfred Dikkers, Yassin Chowdhury, Michael Kriese, Stefan Bäumer, Uwe Zeitner, Torsten Feigl

Author Affiliations +

Proceedings Volume 10583, Extreme Ultraviolet (EUV) Lithography IX; 105830S (2018) https://doi.org/10.1117/12.2297433
Event: SPIE Advanced Lithography, 2018, San Jose, California, United States

Abstract

With the introduction of the NXE:3400B scanner, ASML has brought EUV to High-Volume Manufacturing for sub10nm node lithography. And work has already been started on a successor high-NA system with NA=0.55. For both these systems, node resolution will go down faster than NA increases, resulting in decreasing k₁-factors and tightening of aberration requirements. A crucial component for measuring and controlling aberrations in-situ is a diffuser to fill the full pupil of the projection optics appropriately.

This paper presents several new diffuser concepts, both reflective as well as transmissive, with their respective key performance metrics for both NA=0.33 and NA=0.55 EUV projection optics. These concepts can be used for measuring wavefront quality from dedicated fiducial plates, or for measuring directly from the imaging reticle. The latter would enable a combination of reticle alignment with lens aberration control without throughput penalty.

It will be shown that with these diffuser concepts, we have a solution for in-situ aberration control for 5nm nodes and below.

Conference Presentation

Citation Download Citation

Mark van de Kerkhof, Robbert Jan Voogd, Ad Schasfoort, Evert Westerhuis, Wouter Engelen, Manfred Dikkers, Yassin Chowdhury, Michael Kriese, Stefan Bäumer, Uwe Zeitner, and Torsten Feigl "Diffuser concepts for in-situ wavefront measurements of EUV projection optics", Proc. SPIE 10583, Extreme Ultraviolet (EUV) Lithography IX, 105830S (19 March 2018); https://doi.org/10.1117/12.2297433

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available