Paper
20 July 2018 Dynamic variations in optical properties of graphene oxide in response to gas exposure as determined from thin-film interference
Shawana Tabassum, Liang Dong, Ratnesh Kumar
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Abstract
An approach is presented for measuring the dynamic variations in refractive index (RI) of Graphene Oxide (GO) based optical gas‐sensors [1‐ 3] upon their exposure to gases, using thin‐film interference method [4]. The approach is simple yet effective, and also is physically integratable into the sensing system, a required attribute for being able to measure the dynamically changing RI in response to the ongoing interactions with the analyte. The details can be found in our journal paper [5].
© (2018) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Shawana Tabassum, Liang Dong, and Ratnesh Kumar "Dynamic variations in optical properties of graphene oxide in response to gas exposure as determined from thin-film interference ", Proc. SPIE 10654, Fiber Optic Sensors and Applications XV, 106541J (20 July 2018); https://doi.org/10.1117/12.2305999
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Cited by 1 scholarly publication.
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KEYWORDS
Graphene

Oxides

Ellipsometry

Optical properties

Refractive index

Thin films

Gases

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