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17 September 2018 Coherent Raman scattering at interfaces (Conference Presentation)
Eric O. Potma, John Kenison
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Proceedings Volume 10753, Ultrafast Nonlinear Imaging and Spectroscopy VI; 1075305 (2018) https://doi.org/10.1117/12.2322636
Event: SPIE Optical Engineering + Applications, 2018, San Diego, California, United States
Abstract
Coherent Raman scattering (CRS) is a popular technique for ultrafast spectroscopy and microscopy studies. CRS is based on a third-order nonlinear light-matter interaction, characterized by a nonlinear susceptibility with nonzero elements for bulk samples. It is challenging to perform CRS measurements at interfaces, as bulk contributions can often overwhelm. We have developed a surface-sensitive approach for CRS spectroscopy and microscopy, which enhances the sensitivity to interfacial processes by at least tenfold.
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Eric O. Potma and John Kenison "Coherent Raman scattering at interfaces (Conference Presentation)", Proc. SPIE 10753, Ultrafast Nonlinear Imaging and Spectroscopy VI, 1075305 (17 September 2018); https://doi.org/10.1117/12.2322636
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KEYWORDS
Interfaces
Raman scattering
Chromium
Microscopy
Light-matter interactions
Spectroscopy
Ultrafast laser spectroscopy
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