Paper
24 July 2018 Wavelength-scanning digital holographic method
Author Affiliations +
Proceedings Volume 10827, Sixth International Conference on Optical and Photonic Engineering (icOPEN 2018); 108270R (2018) https://doi.org/10.1117/12.2500864
Event: Sixth International Conference on Optical and Photonic Engineering (icOPEN 2018), 2018, Shanghai, China
Abstract
Surface and internal defects of object are one of the most important reasons causing product quality problems and failures, including micro-cracks, micro-scratches, nano-deposition particles. In order to obtain the multi-layer information of the object, this paper proposes the wavelength-scanning digital holographic method. The algorithm is simulated to analyze the feasibility of acquiring the layered information of objects and the separation effect. Compared with the micro-hologram by compressive sensor, the result shows that digital holographic tomography based on wavelength scanning has a good separation effect on multi-layer object information and defects can be detected clearly.
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Yilei Ding and Yingjie Yu "Wavelength-scanning digital holographic method", Proc. SPIE 10827, Sixth International Conference on Optical and Photonic Engineering (icOPEN 2018), 108270R (24 July 2018); https://doi.org/10.1117/12.2500864
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KEYWORDS
Digital holography

Holography

Holograms

Computer simulations

3D image reconstruction

Computed tomography

Image processing

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