Photoluminescence properties and characterization of LiF-based imaging detector irradiated by 10 keV XFEL beam

F. Bonfigli; N. J. Hartley; Y. Inubushi; M. Koenig; T. Matsuoka; S. Makarov; R. M. Montereali; E. Nichelatti; N. Ozaki; M. Piccinini; S. Pikuz; T. Pikuz; D. Sagae; M. A. Vincenti; M. Yabashi; T. Yabuuchi

doi:10.1117/12.2520907

24 April 2019 Photoluminescence properties and characterization of LiF-based imaging detector irradiated by 10 keV XFEL beam

F. Bonfigli, N. J. Hartley, Y. Inubushi, M. Koenig, T. Matsuoka, S. Makarov, R. M. Montereali, E. Nichelatti, N. Ozaki, M. Piccinini, S. Pikuz, T. Pikuz, D. Sagae, M. A. Vincenti, M. Yabashi, T. Yabuuchi

Author Affiliations +

Proceedings Volume 11035, Optics Damage and Materials Processing by EUV/X-ray Radiation VII; 110350N (2019) https://doi.org/10.1117/12.2520907
Event: SPIE Optics + Optoelectronics, 2019, Prague, Czech Republic

Abstract

We present the study of optical and spectral properties of radiation-induced stable point defects, known as color centers (CCs), in lithium fluoride (LiF) for the detection of 10 keV XFEL beam at Spring-8 Angstrom Compact free electron LAser (SACLA) in Japan. A thick LiF crystal was irradiated in four spots with 10 keV XFEL beam (pulse duration = 10 fs) with different number of accumulated shots. After irradiation the colored-LiF spots were characterized with an optical microscope in fluorescence mode and their photoluminescence intensity and spectra were analyzed.

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F. Bonfigli, N. J. Hartley, Y. Inubushi, M. Koenig, T. Matsuoka, S. Makarov, R. M. Montereali, E. Nichelatti, N. Ozaki, M. Piccinini, S. Pikuz, T. Pikuz, D. Sagae, M. A. Vincenti, M. Yabashi, and T. Yabuuchi "Photoluminescence properties and characterization of LiF-based imaging detector irradiated by 10 keV XFEL beam", Proc. SPIE 11035, Optics Damage and Materials Processing by EUV/X-ray Radiation VII, 110350N (24 April 2019); https://doi.org/10.1117/12.2520907

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