Deployment of combined higher order aberrations to extend the depth of focus of lenses

Davies William de Lima Monteiro; Rodolfo Felipe de Oliveira Costa; Luiz Melk de Carvalho

doi:10.1117/12.2530144

30 August 2019 Deployment of combined higher order aberrations to extend the depth of focus of lenses

Davies William de Lima Monteiro, Rodolfo Felipe de Oliveira Costa, Luiz Melk de Carvalho

Proceedings Volume 11104, Current Developments in Lens Design and Optical Engineering XX; 1110407 (2019) https://doi.org/10.1117/12.2530144
Event: SPIE Optical Engineering + Applications, 2019, San Diego, California, United States

Abstract

This work proposes a lens topology based on the addition of combined high-order aberrations to its posterior surface to achieve an extended depth of focus. The added terms are vertical and horizontal coma and spherical aberration, described by Zernike polynomials. We compare the herein proposed IOL with three classes of IOLs available on the market: monofocal, multifocal and extended depth of focus (EDoF). The proposed lens showed better results off the image plane, confirming the increase in the depth of focus when compared with the monofocal IOL. This is clearly observed with the extended Through-Focus-MTF maps that allow the evaluation of several spatial frequencies at different image planes. The fabricated prototype has similar performance to the Tecnis Symfony, a commercial lens with extended depth of focus. And when the Modulation Transfer Function (MTF) is compared to multifocal lenses, a niche where lenses with extended depth of focus can be possible substitutes, the performance of the herein proposed lens was higher in every case considered.

Conference Presentation

Citation Download Citation

Davies William de Lima Monteiro, Rodolfo Felipe de Oliveira Costa, and Luiz Melk de Carvalho "Deployment of combined higher order aberrations to extend the depth of focus of lenses", Proc. SPIE 11104, Current Developments in Lens Design and Optical Engineering XX, 1110407 (30 August 2019); https://doi.org/10.1117/12.2530144

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available